Deepak Kumar Bihani
5Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Feb 8, 2018 → Apr 5, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10998077B2 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Physics | 2 | Active |
| US11742045B2 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Physics | 1 | Active |
| US11025252B2 | Circuit for detection of single bit upsets in generation of internal clock for memory | Electricity | 0 | Active |
| US10277207B1 | Low voltage, master-slave flip-flop | Physics | 0 | Active |
| US10637447B2 | Low voltage, master-slave flip-flop | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.