Inventor · Allen, TX, US

Devanathan Varadarajan

25Patents
6h-index
17Co-inventors
62Inventor score

Filing activity: Jul 20, 2005 → Dec 21, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7277803B2 Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests Physics 11 Expired
US9053799B2 Optimizing fuseROM usage for memory repair Physics 7 Active
US10600495B2 Parallel memory self-testing Physics 7 Active
US10134483B2 Centralized built-in soft-repair architecture for integrated circuits with embedded memories Physics 6 Active
US9852810B2 Optimizing fuseROM usage for memory repair Physics 6 Active
US9318222B2 Hierarchical, distributed built-in self-repair solution Physics 6 Active
US8051347B2 Scan-enabled method and system for testing a system-on-chip Physics 5 Active
US7555687B2 Sequential scan technique for testing integrated circuits with reduced power, time and/or cost Physics 3 Expired
US11436090B2 Non-volatile memory compression for memory repair Electricity 2 Active
US9698779B2 Reconfiguring an ASIC at runtime Electricity 2 Active
US11373726B2 Management of multiple memory in-field self-repair options Physics 1 Active
US11568951B2 Screening of memory circuits Physics 1 Active
US7380184B2 Sequential scan technique providing enhanced fault coverage in an integrated circuit Physics 0 Expired
US11087857B2 Enabling high at-speed test coverage of functional memory interface logic by selective usage of test paths Physics 0 Active
US12283332B2 Memory BIST circuit and method Physics 0 Active
US12147697B2 Methods and apparatus to characterize memory Physics 0 Active
US11631472B2 Built-in memory repair with repair code compression Physics 0 Active
US12259789B2 Non-volatile memory compression for memory repair Electricity 0 Active
US11748202B2 Non-volatile memory compression for memory repair Electricity 0 Active
US12085610B2 Methods and apparatus to identify faults in processors Physics 0 Active
US12243603B2 At-speed test of functional memory interface logic in devices Physics 0 Active
US12009045B2 Management of multiple memory in-field self-repair options Physics 0 Active
US12217102B2 Distributed mechanism for fine-grained test power control Emerging Cross-Sectional Technologies 0 Active
US12033711B2 Built-in memory repair with repair code compression Physics 0 Active
US11881275B2 Screening of memory circuits Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.