Ekkehard Pruefer
3Patents
1h-index
4Co-inventors
27Inventor score
Filing activity: Sep 19, 2006 → Feb 13, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7358150B2 | Trench isolation structure for a semiconductor device with reduced sidewall stress and a method of manufacturing the same | Electricity | 3 | Active |
| US8697530B2 | Drain/source extension structure of a field effect transistor with reduced boron diffusion | Electricity | 0 | Active |
| US7528026B2 | Method for reducing silicide defects by removing contaminants prior to drain/source activation | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.