Fayez E. Abboud
7Patents
3h-index
11Co-inventors
50Inventor score
Filing activity: Jul 25, 2000 → Jun 29, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6433348B1 | Lithography using multiple pass raster-shaped beam | Electricity | 42 | Expired |
| US7355418B2 | Configurable prober for TFT LCD array test | Physics | 7 | Expired |
| US7330021B2 | Integrated substrate transfer module | Physics | 4 | Expired |
| US7535238B2 | In-line electron beam test system | Electricity | 3 | Expired |
| US7746088B2 | In-line electron beam test system | Electricity | 3 | Active |
| US7919972B2 | Integrated substrate transfer module | Physics | 2 | Active |
| US7973546B2 | In-line electron beam test system | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.