Florin Munteanu
8Patents
2h-index
5Co-inventors
40Inventor score
Filing activity: Jun 29, 2007 → Oct 8, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8275573B1 | Large-surface defect detection by single-frame spatial-carrier interferometry | Physics | 5 | Active |
| US8213021B2 | Interferometric measurement of non-homogeneous multi-material surfaces | Physics | 2 | Active |
| US9282304B1 | Full-color images produced by white-light interferometry | Electricity | 2 | Active |
| US7808652B2 | Interferometric measurement of DLC layer on magnetic head | Physics | 1 | Active |
| US9752868B2 | Optical measurement of lead angle of groove in manufactured part | Emerging Cross-Sectional Technologies | 1 | Active |
| US7505863B2 | Interferometric iterative technique with bandwidth and numerical-aperture dependency | Physics | 1 | Active |
| US8416425B2 | Interferometric measurement of non-homogeneous multi-material surfaces | Physics | 0 | Active |
| US8482741B2 | Interferometric measurement of non-homogeneous multi-material surfaces | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.