Inventor · Meylan, FR

François Wacquant

4Patents
1h-index
6Co-inventors
27Inventor score

Filing activity: Aug 7, 2003 → Jun 21, 2004

Most-cited inventions

PatentTitleAreaCited byStatus
US7018865B2 Method of protecting an element of an integrated circuit against the formation of a metal silicide Electricity 1 Expired
US7022595B2 Method for the selective formation of a silicide on a wafer using an implantation residue layer Electricity 1 Expired
US7188411B2 Process for forming portions of a compound material inside a cavity Emerging Cross-Sectional Technologies 0 Expired
US7041585B2 Process for producing an integrated electronic component Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.