Fred H. Pollak
8Patents
8h-index
8Co-inventors
58Inventor score
Filing activity: Nov 30, 1977 → Mar 31, 1992
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5270797A | Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control | Physics | 25 | Expired |
| US5260772A | Method and apparatus for determining a material's characteristics by photoreflectance | Physics | 21 | Expired |
| US4214916A | Thin film photovoltaic converter and method of preparing same | Emerging Cross-Sectional Technologies | 17 | Expired |
| US5255070A | Method for determining interface properties of semiconductor materials by photoreflectance | Physics | 12 | Expired |
| US5287169A | Contractless mode of electroreflectance | Physics | 11 | Expired |
| US5255071A | Photoreflectance method and apparatus utilizing acousto-optic modulation | Physics | 9 | Expired |
| US4142802A | Method and apparatus for measuring variations in composition in binary and ternary semiconductors utilizing electrolyte electroreflectance | Physics | 8 | Expired |
| US5159410A | Method for in-situ determination of the fermi level in GaAs and similar materials by photoreflectance | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.