Gad Neumann
15Patents
8h-index
8Co-inventors
61Inventor score
Filing activity: Nov 12, 1991 → Jan 15, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5699447A | Two-phase optical inspection method and apparatus for defect detection | Physics | 177 | Expired |
| US6178257A | Substrate inspection method and apparatus | Physics | 101 | Expired |
| US5982921A | Optical inspection method and apparatus | Physics | 61 | Expired |
| US6693664B2 | Method and system for fast on-line electro-optical detection of wafer defects | Physics | 16 | Expired |
| US6892013B2 | Fiber optical illumination system | Physics | 16 | Expired |
| US7180586B2 | System for detection of wafer defects | Physics | 15 | Expired |
| US6952491B2 | Optical inspection apparatus for substrate defect detection | Physics | 12 | Expired |
| US7633041B2 | Apparatus for determining optimum position of focus of an imaging system | Physics | 11 | Active |
| US7961763B2 | System for detection of wafer defects | Physics | 8 | Active |
| US7796807B2 | Optical inspection apparatus for substrate defect detection | Physics | 8 | Active |
| US7525659B2 | System for detection of water defects | Physics | 8 | Expired |
| US7499583B2 | Optical inspection method for substrate defect detection | Physics | 8 | Expired |
| US7260298B2 | Fiber optical illumination system | Physics | 4 | Expired |
| US7843559B2 | System for detection of wafer defects | Physics | 4 | Active |
| US7477383B2 | System for detection of wafer defects | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.