Gary E. Sommargren
34Patents
18h-index
8Co-inventors
74Inventor score
Filing activity: Jun 16, 1980 → Jan 23, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5969848A | Micromachined electrostatic vertical actuator | Physics | 76 | Expired |
| US4688940A | Heterodyne interferometer system | Physics | 68 | Expired |
| US4594003A | Interferometric wavefront measurement | Physics | 67 | Expired |
| US4606638A | Distance measuring interferometer and method of use | Physics | 66 | Expired |
| US4963022A | Method and apparatus for generating a straight reference line | Physics | 60 | Expired |
| US4859066A | Linear and angular displacement measuring interferometer | Physics | 53 | Expired |
| US4802765A | Differential plane mirror having beamsplitter/beam folder assembly | Physics | 52 | Expired |
| US4733967A | Apparatus for the measurement of the refractive index of a gas | Physics | 46 | Expired |
| US5548403A | Phase shifting diffraction interferometer | Physics | 40 | Expired |
| US5933236A | Phase shifting interferometer | Physics | 39 | Expired |
| US4685803A | Method and apparatus for the measurement of the refractive index of a gas | Physics | 35 | Expired |
| US4746216A | Angle measuring interferometer | Physics | 34 | Expired |
| US4353650A | Laser heterodyne surface profiler | Physics | 32 | Expired |
| US4881815A | Linear and angular displacement measuring interferometer | Physics | 29 | Expired |
| US4693605A | Differential plane mirror interferometer | Physics | 27 | Expired |
| US4684828A | Apparatus to transform a single frequency, linearly polarized laser beam into a beam with two, orthogonally polarized frequencies | Physics | 25 | Expired |
| US5218424A | Flying height and topography measuring interferometer | Physics | 22 | Expired |
| US4787747A | Straightness of travel interferometer | Physics | 21 | Expired |
| US4687958A | Apparatus to transform a single frequency, linearly polarized laser beam into a high efficiency beam with two, orthogonally polarized frequencies | Physics | 18 | Expired |
| US4950078A | High accuracy differential plane mirror interferometer | Physics | 18 | Expired |
| US4752133A | Differential plane mirror interferometer | Physics | 17 | Expired |
| US4802764A | Differential plane mirror interferometer having beamsplitter/beam folder assembly | Physics | 16 | Expired |
| US4456339A | Laser heterodyne surface profiler | Physics | 14 | Expired |
| US4717250A | Angle measuring interferometer | Physics | 14 | Expired |
| US5133599A | High accuracy linear displacement interferometer with probe | Physics | 13 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.