Gerrit Farber
3Patents
1h-index
5Co-inventors
30Inventor score
Filing activity: Mar 25, 2002 → Mar 4, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6917214B2 | Method for testing a plurality of devices disposed on a wafer and connected by a common data line | Electricity | 3 | Expired |
| US6992498B2 | Test apparatus for testing integrated modules and method for operating a test apparatus | Physics | 1 | Expired |
| US6773934B2 | Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.