Test apparatus for testing integrated modules and method for operating a test apparatus

US6992498B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Manfred Proll · Dorfen, DE
• Gerrit Farber · Hersbruck, DE

Key dates

• Filing date: Mar 4, 2004
• Grant date: Jan 31, 2006
• Expiry date: Mar 4, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C2029/2602
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test apparatus for testing integrated modules has a plurality of connection locations on a carrier substrate. An integrated module may be connected, via a connection location, to a test unit connected to the carrier substrate. The connection locations are arranged in groups within a connection array. A control terminal via which an integrated module may be selected for a test can be provided for each connection location. An address and command terminal can be provided for each connection location. The modules of the number of groups, which are simultaneously operated, are connected to the address and command bus via the respective switching means or switch. The test frequency can thus be increased without adversely affecting the driver load.