Gordon Abbott
3Patents
3h-index
9Co-inventors
36Inventor score
Filing activity: Dec 5, 2007 → Feb 16, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7904845B2 | Determining locations on a wafer to be reviewed during defect review | Physics | 38 | Active |
| US8194968B2 | Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions | Physics | 25 | Active |
| US8175373B2 | Use of design information and defect image information in defect classification | Physics | 13 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.