Greg Bazan
6Patents
3h-index
12Co-inventors
43Inventor score
Filing activity: Jul 27, 2004 → Sep 24, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7240322B2 | Method of adding fabrication monitors to integrated circuit chips | Electricity | 59 | Expired |
| US7194706B2 | Designing scan chains with specific parameter sensitivities to identify process defects | Electricity | 13 | Expired |
| US6998866B1 | Circuit and method for monitoring defects | Electricity | 8 | Expired |
| US7620931B2 | Method of adding fabrication monitors to integrated circuit chips | Electricity | 1 | Active |
| US7323278B2 | Method of adding fabrication monitors to integrated circuit chips | Electricity | 1 | Active |
| US7089514B2 | Defect diagnosis for semiconductor integrated circuits | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.