Hiroshi Miyai
55Patents
14h-index
73Co-inventors
87Inventor score
Filing activity: Sep 17, 1992 → Jan 16, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6952492B2 | Method and apparatus for inspecting a semiconductor device | Physics | 43 | Expired |
| US6465781B1 | Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus | Electricity | 43 | Expired |
| US6628248B2 | Image display apparatus and method for compensating display image of image display apparatus | Physics | 42 | Expired |
| US6865288B1 | Pattern inspection method and apparatus | Physics | 35 | Expired |
| US6583634B1 | Method of inspecting circuit pattern and inspecting instrument | Electricity | 34 | Expired |
| US5838396A | Projection type image display apparatus with circuit for correcting luminance nonuniformity | Electricity | 33 | Expired |
| US5349460A | Remote control system for controlling a television receiver | Electricity | 29 | Expired |
| US6570611B1 | Image display | Physics | 28 | Expired |
| US6703850B2 | Method of inspecting circuit pattern and inspecting instrument | Electricity | 20 | Expired |
| US6511184B2 | Color image display apparatus | Physics | 20 | Expired |
| US6898305B2 | Circuit pattern inspection method and apparatus | Physics | 19 | Expired |
| US7116816B2 | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen | Electricity | 19 | Expired |
| US7034298B2 | Inspection method and apparatus using an electron beam | Electricity | 19 | Expired |
| US5933473A | Non-destructive inspection apparatus and inspection system using it | Physics | 17 | Expired |
| US5640462A | Imaging method of X-ray computerized tomography and apparatus for X-ray computerized tomography | Physics | 14 | Expired |
| US7269280B2 | Method and its apparatus for inspecting a pattern | Physics | 12 | Expired |
| US7607784B2 | Light emission method, light emitting apparatus and projection display apparatus | Physics | 12 | Expired |
| US6333962A | Non-destructive inspection apparatus and inspection system using it | Physics | 11 | Expired |
| US7071468B2 | Circuit pattern inspection method and its apparatus | Electricity | 11 | Expired |
| US6771419B1 | Rear projection type image display unit | Electricity | 11 | Expired |
| US6943752B2 | Presentation system, a display device, and a program | Physics | 11 | Expired |
| US8421010B2 | Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample | Electricity | 10 | Active |
| US7133550B2 | Pattern inspection method and apparatus | Electricity | 9 | Expired |
| US7294833B2 | Method of alignment for efficient defect review | Electricity | 9 | Expired |
| US7425704B2 | Inspection method and apparatus using an electron beam | Electricity | 9 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.