Inventor · Aliso Viejo, CA, US

James E. Millerd

20Patents
10h-index
13Co-inventors
72Inventor score

Filing activity: Jul 2, 1993 → Jan 21, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US6304330A Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry Physics 67 Expired
US5682236A Remote measurement of near-surface physical properties using optically smart surfaces Physics 48 Expired
US7230717B2 Pixelated phase-mask interferometer Physics 32 Expired
US5838439A Heterodyned self-mixing laser diode vibrometer Physics 30 Expired
US6552808B2 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry Physics 21 Expired
US7057738B2 Simultaneous phase-shifting Fizeau interferometer Physics 19 Expired
US7057737B2 Common optical-path testing of high-numerical-aperture wavefronts Physics 17 Expired
US9958251B1 Single snap-shot fringe projection system Physics 15 Active
US7298497B2 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry Physics 15 Expired
US8351048B2 Linear-carrier phase-mask interferometer Physics 14 Active
US7777895B2 Linear-carrier phase-mask interferometer Physics 8 Active
US7079251B2 Calibration and error correction in multi-channel imaging Physics 7 Expired
US7170611B2 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry Physics 7 Expired
US7675628B2 Synchronous frequency-shift mechanism in Fizeau interferometer Physics 6 Active
US7230718B2 Simultaneous phase-shifting fizeau interferometer Physics 6 Expired
US8345258B2 Synchronous frequency-shift mechanism in fizeau interferometer Physics 5 Active
US9857169B1 Single-step interferometric radius-of-curvature measurements utilizing short-coherence sources Physics 3 Active
US11262191B1 On-axis dynamic interferometer and optical imaging systems employing the same Physics 2 Active
US12216051B2 Dynamic phase-shift interferometer utilizing a synchronous optical frequency-shift Physics 0 Active
US11353316B1 Interferometry with pixelated color discriminating elements combined with pixelated polarization masks Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.