James E. Tracy
13Patents
8h-index
17Co-inventors
65Inventor score
Filing activity: Dec 22, 1988 → Aug 23, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5834565A | Curable polyphenylene ether-thermosetting resin composition and process | Electricity | 68 | Expired |
| US5213886A | Curable dielectric polyphenylene ether-polyepoxide compositions | Emerging Cross-Sectional Technologies | 41 | Expired |
| US5043367A | Curable dielectric polyphenylene ether-polyepoxide compositions useful in printed circuit board production | Emerging Cross-Sectional Technologies | 25 | Expired |
| US6051662A | Curable polyphenylene ether-thermosetting resin composition and process | Electricity | 24 | Expired |
| US5262491A | High performance curable PPO/monomeric epoxy compositions with tin metal salt compatibilizing agent | Electricity | 17 | Expired |
| US5162450A | Curable dielectric polyphenylene ether-polyepoxide compositions | Electricity | 13 | Expired |
| US5108842A | Curable dielectric polyphenylene ether-polyepoxide compositions useful in printed circuit board production | Emerging Cross-Sectional Technologies | 12 | Expired |
| US6906120B1 | Poly(arylene ether) adhesive compositions | Emerging Cross-Sectional Technologies | 9 | Expired |
| US7022777B2 | Moldable poly(arylene ether) thermosetting compositions, methods, and articles | Chemistry; Metallurgy | 5 | Expired |
| US7090920B2 | Poly(arylene ether) adhesive compositions | Emerging Cross-Sectional Technologies | 4 | Expired |
| US8888418B2 | Fan rub strip in situ machining system and method | Emerging Cross-Sectional Technologies | 4 | Active |
| US5364703A | Copper-clad polyetherimide laminates with high peel strength | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7393895B2 | Forming concentrate of poly(arylene ether), thermosetting resin and compatibilizer | Chemistry; Metallurgy | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.