Jeonghoon Ko
4Patents
1h-index
20Co-inventors
37Inventor score
Filing activity: Jul 19, 2017 → Feb 22, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10650910B2 | Semiconductor fault analysis device and fault analysis method thereof | Physics | 2 | Active |
| US11733603B2 | Proximity correction methods for semiconductor manufacturing processes | Electricity | 1 | Active |
| US10254236B2 | Methods of measuring patterns and methods of manufacturing semiconductor devices including the same | Electricity | 0 | Active |
| US11669773B2 | Electronic devices generating verification vector for verifying semiconductor circuit and methods of operating the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.