Ji-Ping Li
14Patents
5h-index
12Co-inventors
63Inventor score
Filing activity: Aug 16, 1993 → Oct 13, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5415126A | Method of forming crystalline silicon carbide coatings at low temperatures | Chemistry; Metallurgy | 34 | Expired |
| US6971791B2 | Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough | Electricity | 23 | Expired |
| US6958814B2 | Apparatus and method for measuring a property of a layer in a multilayered structure | Physics | 11 | Expired |
| US11170808B1 | Dual free layer reader head with magnetic seed layer decoupled from shield | Physics | 10 | Active |
| US6885444B2 | Evaluating a multi-layered structure for voids | Physics | 8 | Expired |
| US7064822B2 | Evaluating a multi-layered structure for voids | Physics | 5 | Expired |
| US7141440B2 | Apparatus and method for measuring a property of a layer in a multilayered structure | Physics | 5 | Expired |
| US11514935B1 | Magnetic read sensors having stabilized upper readers, and related methods | Physics | 4 | Active |
| US7301619B2 | Evaluating a multi-layered structure for voids | Physics | 4 | Active |
| US11127422B1 | Magnetic read sensors and related methods having a rear hard bias and no AFM layer | Physics | 3 | Active |
| US10909024B2 | System and method for testing electronic visual user interface outputs | Physics | 2 | Active |
| US7088444B2 | Evaluating a multi-layered structure for voids | Physics | 1 | Expired |
| US11531138B2 | Processes and systems for correlating well logging data | Fixed Constructions | 0 | Active |
| US11430470B2 | Magnetic read sensors and related methods having a rear hard bias and no AFM layer | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.