Joerg G. Appinger
4Patents
3h-index
9Co-inventors
43Inventor score
Filing activity: Jun 11, 2003 → Jun 8, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7225376B2 | Method and system for coding test pattern for scan design | Physics | 6 | Expired |
| US6983407B2 | Random pattern weight control by pseudo random bit pattern generator initialization | Electricity | 5 | Expired |
| US9977053B2 | Wafer probe alignment | Physics | 4 | Active |
| US9927463B2 | Wafer probe alignment | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.