John A. Benavides
8Patents
4h-index
5Co-inventors
42Inventor score
Filing activity: Apr 13, 2000 → Jan 11, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6618827B1 | System and method for parallel testing of IEEE 1149.1 compliant integrated circuits | Physics | 22 | Expired |
| US7228472B2 | System and method to control data capture | Physics | 10 | Expired |
| US6634005B1 | System and method for testing an interface between two digital integrated circuits | Physics | 6 | Expired |
| US7348799B2 | System and method for generating a trigger signal | Physics | 5 | Expired |
| US7752016B2 | System and method for data analysis | Physics | 3 | Expired |
| US7809991B2 | System and method to qualify data capture | Physics | 3 | Active |
| US6786760B1 | Method and system for sensing IC package orientation in sockets | Electricity | 2 | Expired |
| US6786761B1 | Method and system for sensing the status of a ZIF socket lever | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.