Jonathan A. Nelson
4Patents
3h-index
5Co-inventors
43Inventor score
Filing activity: Apr 28, 2006 → Oct 2, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7406860B2 | Atomic force microscopy scanning and image processing | Physics | 16 | Expired |
| US8296860B2 | Atomic force microscopy true shape measurement method | Physics | 6 | Active |
| US9150415B2 | Atomic force microscopy of scanning and image processing | Physics | 5 | Active |
| US10126326B2 | Atomic force microscopy of scanning and image processing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.