Jonathan Iloreta
5Patents
2h-index
22Co-inventors
43Inventor score
Filing activity: Dec 12, 2012 → Aug 28, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9127927B2 | Techniques for optimized scatterometry | Physics | 3 | Active |
| US10794839B2 | Visualization of three-dimensional semiconductor structures | Electricity | 3 | Active |
| US11099137B2 | Visualization of three-dimensional semiconductor structures | Electricity | 2 | Active |
| US9553033B2 | Semiconductor device models including re-usable sub-structures | Electricity | 1 | Active |
| US10393647B1 | System, method, and computer program product for automatically determining a parameter causing an abnormal semiconductor metrology measurement | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.