Jonathan S. Morrell
16Patents
5h-index
17Co-inventors
63Inventor score
Filing activity: Sep 30, 1999 → Apr 24, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6440211B1 | Method of depositing buffer layers on biaxially textured metal substrates | Chemistry; Metallurgy | 28 | Expired |
| US7601294B2 | High volume production of nanostructured materials | Performing Operations; Transporting | 25 | Active |
| US6663976B2 | Laminate articles on biaxially textured metal substrates | Chemistry; Metallurgy | 21 | Expired |
| US10054697B1 | Device and method for locating a radiation emitting source via angular dependence using a single detection crystal | Physics | 9 | Active |
| US7527669B2 | Displacement method and apparatus for reducing passivated metal powders and metal oxides | Chemistry; Metallurgy | 6 | Active |
| US7909907B1 | Methods for high volume production of nanostructured materials | Performing Operations; Transporting | 4 | Active |
| US7323024B2 | Vessel with filter and method of use | Performing Operations; Transporting | 2 | Expired |
| US10191161B1 | Device and method for the location and identification of a radiation source | Physics | 2 | Active |
| US9978469B1 | Radiation area monitor device and method | Physics | 2 | Active |
| US9881708B1 | Radiation area monitor device and method | Physics | 1 | Active |
| US7603963B2 | Controlled zone microwave plasma system | Electricity | 1 | Active |
| US7622189B2 | Ceramic nanostructures and methods of fabrication | Emerging Cross-Sectional Technologies | 1 | Active |
| US11400688B1 | Thermal protection barrier | Fixed Constructions | 0 | Active |
| US8028654B2 | Planar controlled zone microwave plasma system | Electricity | 0 | Active |
| US10655939B1 | Thermal protection barrier for delaying access | Fixed Constructions | 0 | Active |
| US8114677B2 | Passive in-situ chemical sensor | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.