Jong Shin
3Patents
2h-index
5Co-inventors
37Inventor score
Filing activity: Dec 27, 1999 → Mar 10, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6243309A | Semiconductor memory device having parallel test mode for simultaneously testing multiple memory cells | Physics | 11 | Expired |
| US6470465B1 | Parallel test circuit of semiconductor memory device | Physics | 2 | Expired |
| US9059400B2 | Magnetic random access memory cells with isolating liners | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.