Inventor · Fujisawa, JP

Kengo Imagawa

18Patents
3h-index
27Co-inventors
60Inventor score

Filing activity: Mar 6, 2003 → Nov 8, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7474290B2 Semiconductor device and testing method thereof Physics 4 Active
US7816955B2 Ramp generator and circuit pattern inspection apparatus using the same ramp generator Electricity 3 Active
US6774680B2 Comparator including a differential transistor pair and a diode arrangement Electricity 3 Expired
US7668027B2 Semiconductor device, testing and manufacturing methods thereof Physics 2 Expired
US7443373B2 Semiconductor device and the method of testing the same Physics 2 Expired
US10448923B2 Amplifier circuit and ultrasonic probe Electricity 1 Active
US7358953B2 Semiconductor device and testing method of semiconductor device Emerging Cross-Sectional Technologies 1 Expired
US11284859B2 Ultrasonic diagnostic apparatus and probe used for the same General 0 Revoked
US10799213B2 Ultrasound probe, element circuit thereof, and ultrasound diagnostic device using same Performing Operations; Transporting 0 Active
US11921241B2 Ultrasonic probe and ultrasonic diagnostic apparatus using thereon Physics 0 Active
US10499885B2 Ultrasound system and method, and ultrasound probe Physics 0 Active
US12408895B2 Ultrasound probe and ultrasound diagnostic apparatus Physics 0 Active
US11844653B2 Probe and ultrasound diagnostic device using the same Physics 0 Active
US11357476B2 Ultrasonic diagnostic apparatus and probe used for the same Physics 0 Active
US11331693B2 Ultrasonic transducer array and ultrasonic probe Performing Operations; Transporting 0 Active
US8035071B2 Contamination-inspecting apparatus and detection circuit Physics 0 Active
US11191527B2 Ultrasonic diagnostic apparatus and probe used for the same Electricity 0 Active
US11660076B2 Ultrasonic probe, ultrasonic diagnostic apparatus, and ultrasonic transmission/reception switching method Human Necessities 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.