Kevin Boyd
10Patents
3h-index
20Co-inventors
56Inventor score
Filing activity: Aug 19, 2004 → Oct 22, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7864502B2 | In situ monitoring of wafer charge distribution in plasma processing | Emerging Cross-Sectional Technologies | 10 | Active |
| US7251250B2 | Method and apparatus for efficient sharing of communication system resources | Electricity | 4 | Expired |
| US10083436B1 | Electronic payment systems and methods | Physics | 3 | Active |
| US7664078B2 | Method and apparatus for efficient sharing of communication system resources | Electricity | 1 | Active |
| US10153232B2 | Crack stop with overlapping vias | Electricity | 1 | Active |
| US10791104B2 | Systems and methods for authenticating users of a computer system | Electricity | 1 | Active |
| US10686774B2 | Authentication systems and methods for online services | Electricity | 1 | Active |
| US10090258B1 | Crack-stop structure for an IC product and methods of making such a crack-stop structure | Electricity | 0 | Active |
| US8358632B2 | Method and apparatus for efficient sharing of communication system resources | Electricity | 0 | Active |
| US11283605B2 | Electronic verification systems and methods | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.