Kim Pierce
15Patents
9h-index
22Co-inventors
64Inventor score
Filing activity: Mar 5, 1996 → Jan 14, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5935263A | Method and apparatus for memory array compressed data testing | Physics | 472 | Expired |
| US6365421B2 | Method and apparatus for storage of test results within an integrated circuit | Physics | 73 | Expired |
| US6194738A | Method and apparatus for storage of test results within an integrated circuit | Physics | 67 | Expired |
| US5631862A | Self current limiting antifuse circuit | Physics | 52 | Expired |
| US6178532A | On-chip circuit and method for testing memory devices | Physics | 43 | Expired |
| US5706238A | Self current limiting antifuse circuit | Physics | 23 | Expired |
| US5864565A | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Physics | 15 | Expired |
| US6185705A | Method and apparatus for checking the resistance of programmable elements | Physics | 15 | Expired |
| US6546512B1 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Physics | 9 | Expired |
| US6536004B2 | On-chip circuit and method for testing memory devices | Physics | 8 | Expired |
| US5982656A | Method and apparatus for checking the resistance of programmable elements | Physics | 7 | Expired |
| US6314538A | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Physics | 6 | Expired |
| US6154410A | Method and apparatus for reducing antifuse programming time | Physics | 6 | Expired |
| US6983404B2 | Method and apparatus for checking the resistance of programmable elements | Physics | 4 | Expired |
| US6665827B2 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.