Koshi Ueda
7Patents
6h-index
7Co-inventors
45Inventor score
Filing activity: Jan 14, 1994 → Jun 18, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5640539A | IC analysis system having charged particle beam apparatus for improved contrast image | Physics | 31 | Expired |
| US5528156A | IC analysis system and electron beam probe system and fault isolation method therefor | Physics | 20 | Expired |
| US5780859A | Electrostatic-magnetic lens arrangement | Electricity | 20 | Expired |
| US5592099A | IC tester joined with ion beam tester and the detection method of the failure part of IC | Physics | 13 | Expired |
| US5895917A | Detector objective lens | Electricity | 10 | Expired |
| US5633595A | IC analysis system and electron beam probe system and fault isolation method therefor | Physics | 8 | Expired |
| US5589780A | IC Analysis system and electron beam probe system and fault isolation method therefor | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.