Lien-Che Ho
4Patents
3h-index
8Co-inventors
36Inventor score
Filing activity: Aug 15, 2002 → Jun 8, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6773937B1 | Method of verifying a mask for a mask ROM | Electricity | 12 | Expired |
| US7551503B2 | Method for refreshing a flash memory | Physics | 6 | Active |
| US6684164B1 | True defect monitoring through repeating defect deletion | Physics | 3 | Expired |
| US6794203B2 | Method of calculating the real added defect counts | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.