Lo Keng Foo
7Patents
6h-index
6Co-inventors
52Inventor score
Filing activity: Mar 27, 2000 → Sep 14, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6724214B2 | Test structures for on-chip real-time reliability testing | Electricity | 94 | Expired |
| US6344385B1 | Dummy layer diode structures for ESD protection | Electricity | 16 | Expired |
| US7285458B2 | Method for forming an ESD protection circuit | Emerging Cross-Sectional Technologies | 16 | Expired |
| US7615417B2 | Triggered silicon controlled rectifier for RF ESD protection | Emerging Cross-Sectional Technologies | 15 | Active |
| US6552399B2 | Dummy layer diode structures for ESD protection | Electricity | 12 | Expired |
| US6842078B2 | Ring oscillator with variable loading | Electricity | 9 | Expired |
| US8134211B2 | Triggered silicon controlled rectifier for RF ESD protection | Emerging Cross-Sectional Technologies | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.