Manouk RIJPSTRA
5Patents
1h-index
30Co-inventors
40Inventor score
Filing activity: Sep 4, 2018 → Nov 4, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10527958B2 | Lithographic method | Physics | 6 | Active |
| US11448973B2 | Computational metrology based correction and control | Emerging Cross-Sectional Technologies | 1 | Active |
| US11029610B2 | Lithographic method | Physics | 1 | Active |
| US10962887B2 | Lithographic method | Physics | 0 | Active |
| US12189314B2 | Metrology method and associated metrology and lithographic apparatuses | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.