Mark Andrew Banke
4Patents
2h-index
8Co-inventors
33Inventor score
Filing activity: Apr 28, 2004 → Jun 16, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7020582B1 | Methods and apparatus for laser marking of integrated circuit faults | Physics | 10 | Expired |
| US7768280B1 | Apparatus for a low-cost semiconductor test interface system | Physics | 5 | Active |
| US8466704B1 | Probe cards with minimized cross-talk | Physics | 2 | Active |
| US8786301B1 | Apparatus for a low-cost semiconductor test interface system | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.