Mark D. DiManna
10Patents
3h-index
15Co-inventors
57Inventor score
Filing activity: Jul 13, 2004 → May 2, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7161159B2 | Dual beam system | Electricity | 14 | Expired |
| US7601976B2 | Dual beam system | Electricity | 6 | Active |
| US8013311B2 | Dual beam system | Electricity | 3 | Active |
| US8399864B2 | Dual beam system | Electricity | 2 | Active |
| US8633451B2 | Ion sources, systems and methods | Electricity | 1 | Active |
| US8993981B2 | Charged particle source with light monitoring for tip temperature determination | Electricity | 0 | Active |
| US9530611B2 | Charged particle beam system and method of operating a charged particle beam system | Electricity | 0 | Active |
| US9530612B2 | Charged particle beam system and method of operating a charged particle beam system | Electricity | 0 | Active |
| US12044638B2 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | Physics | 0 | Active |
| US12270774B2 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.