Mark Waggoner
6Patents
4h-index
11Co-inventors
50Inventor score
Filing activity: Mar 6, 1992 → Jan 2, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5640509A | Programmable built-in self-test function for an integrated circuit | Physics | 56 | Expired |
| US5164943A | Cyclic redundancy check circuit | Electricity | 16 | Expired |
| US5245617A | First-in, first-out memory circuit | Electricity | 12 | Expired |
| US5617534A | Interface protocol for testing of a cache memory | Physics | 9 | Expired |
| US8205111B2 | Communicating via an in-die interconnect | Physics | 4 | Active |
| US7587650B2 | Clock jitter detector | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.