Matthew Steven Hyde
4Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Sep 11, 2019 → Sep 17, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10998075B2 | Built-in self-test for bit-write enabled memory arrays | Physics | 1 | Active |
| US11081202B2 | Failing address registers for built-in self tests | Physics | 1 | Active |
| US11069422B1 | Testing multi-port array in integrated circuits | Physics | 0 | Active |
| US11657887B2 | Testing bit write operation to a memory array in integrated circuits | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.