Mei-Chen Chen
3Patents
1h-index
21Co-inventors
37Inventor score
Filing activity: May 15, 2014 → Aug 23, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9653404B1 | Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer | Electricity | 3 | Active |
| US9530646B2 | Method of forming a semiconductor structure | Electricity | 0 | Active |
| US9373505B2 | Mark segmentation method and method for manufacturing a semiconductor structure applying the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.