Michael Combs
6Patents
3h-index
21Co-inventors
57Inventor score
Filing activity: Jan 12, 1990 → Jun 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5127011A | Per-pin integrated circuit test system having n-bit interface | Physics | 14 | Expired |
| US7222274B2 | Testing and repair methodology for memories having redundancy | Physics | 13 | Expired |
| US7010733B2 | Parametric testing for high pin count ASIC | Physics | 4 | Expired |
| US6724210B2 | Method and apparatus for reduced pin count package connection verification | Physics | 2 | Expired |
| US6931346B2 | Method and apparatus for reduced pin count package connection verification | Physics | 1 | Expired |
| US12417090B1 | Software development observability platform | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.