Michael E. Simmons
17Patents
5h-index
28Co-inventors
66Inventor score
Filing activity: Aug 15, 1997 → Oct 23, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6847219B1 | Probe station with low noise characteristics | Physics | 65 | Expired |
| US9724149B2 | Surgical implant system and method | Human Necessities | 18 | Active |
| US5901481A | Ironing device for infant and children's clothing | Textiles; Paper | 13 | Expired |
| US7138810B2 | Probe station with low noise characteristics | Physics | 11 | Expired |
| US7295025B2 | Probe station with low noise characteristics | Physics | 6 | Active |
| US7550984B2 | Probe station with low noise characteristics | Physics | 4 | Active |
| US9506973B2 | High voltage chuck for a probe station | Emerging Cross-Sectional Technologies | 3 | Active |
| US9741599B2 | High voltage chuck for a probe station | Emerging Cross-Sectional Technologies | 2 | Active |
| US10062597B2 | High voltage chuck for a probe station | Emerging Cross-Sectional Technologies | 2 | Active |
| US9991152B2 | Wafer-handling end effectors with wafer-contacting surfaces and sealing structures | Emerging Cross-Sectional Technologies | 2 | Active |
| US10060950B2 | Shielded probe systems | Physics | 1 | Active |
| US8167648B2 | Low noise connector with cables having a center, middle and outer conductors | Electricity | 0 | Active |
| US11047795B2 | Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems | Physics | 0 | Active |
| US10736672B2 | Spinal implant system and method | Human Necessities | 0 | Active |
| US11131709B2 | Probe systems for optically probing a device under test and methods of operating the probe systems | Physics | 0 | Active |
| US11874301B2 | Probe systems including imaging devices with objective lens isolators, and related methods | Physics | 0 | Active |
| US10698002B2 | Probe systems for testing a device under test | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.