Mike Adel
13Patents
6h-index
16Co-inventors
59Inventor score
Filing activity: May 10, 1999 → Oct 30, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6276798A | Spectral bio-imaging of the eye | Physics | 121 | Expired |
| US7656528B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 49 | Active |
| US8175831B2 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Electricity | 34 | Active |
| US9476698B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 15 | Active |
| US7925486B2 | Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout | Physics | 12 | Active |
| US8525994B2 | Periodic patterns and technique to control misaligment between two layers | Electricity | 9 | Active |
| US8570515B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 3 | Active |
| US10649447B2 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Electricity | 1 | Active |
| US9234745B2 | Periodic patterns and techniques to control misalignment between two layers | Electricity | 0 | Active |
| US9651943B2 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Electricity | 0 | Active |
| US9835447B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 0 | Active |
| US10151584B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 0 | Active |
| US9103662B2 | Periodic patterns and technique to control misalignment between two layers | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.