Inventor · Yamanashi, JP

Mitsuhiro Ishihara

17Patents
8h-index
14Co-inventors
69Inventor score

Filing activity: Dec 28, 1993 → Jun 23, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5737084A Three-dimensional shape measuring apparatus Physics 249 Expired
US6288382A Micro-scanning multislit confocal image acquisition apparatus Physics 33 Expired
US6108090A Three-dimensional shape measuring apparatus Physics 32 Expired
US5946100A Three-dimensional shape measuring apparatus Physics 32 Expired
US6373978B1 Three-dimensional shape measuring apparatus Physics 29 Expired
US7733538B2 Image reading apparatus Electricity 25 Active
US5687031A Three-dimensional image acquisition apparatus Physics 17 Expired
US6399942B1 Active confocal image acquisition apparatus and method of three-dimensional measurement using same Physics 15 Expired
US5347370A Shading correction method and apparatus Electricity 7 Expired
US7092093B2 Polarization bearing detection type two-dimensional light reception timing detecting device and surface form measuring device using the same Physics 4 Expired
US10029880B2 Sheet bundle binding device and image forming system having the same Physics 3 Active
US7126726B2 Image reading apparatus Electricity 2 Expired
US10234808B2 Sheet bundle binding device and image forming system having the same Physics 1 Active
US9435982B2 Focus position changing apparatus and confocal optical apparatus using the same Physics 1 Active
US9341469B2 Continuous scan type measuring apparatus Physics 0 Active
US9041940B2 Three-dimensional shape measuring apparatus Physics 0 Active
US11915955B1 Workpiece inspection apparatus Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.