Mohsin Waqar
7Patents
0h-index
24Co-inventors
37Inventor score
Filing activity: Feb 2, 2016 → Dec 4, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10361099B2 | Systems and methods of gap calibration via direct component contact in electronic device manufacturing systems | Electricity | 0 | Active |
| US11031262B2 | Loadlock integrated bevel etcher system | Electricity | 0 | Active |
| US10636684B2 | Loadlock integrated bevel etcher system | Electricity | 0 | Active |
| US11813757B2 | Centerfinding for a process kit or process kit carrier at a manufacturing system | Emerging Cross-Sectional Technologies | 0 | Active |
| US10916451B2 | Systems and methods of gap calibration via direct component contact in electronic device manufacturing systems | Electricity | 0 | Active |
| US12215966B2 | Methods and systems of optical inspection of electronic device manufacturing machines | Performing Operations; Transporting | 0 | Active |
| US10403515B2 | Loadlock integrated bevel etcher system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.