Morihiko Hamada
3Patents
2h-index
11Co-inventors
31Inventor score
Filing activity: Oct 31, 2002 → Feb 10, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7171592B2 | Self-testing circuit in semiconductor memory device | Physics | 8 | Expired |
| US6765401B2 | Semiconductor testing apparatus for conducting conduction tests | Physics | 7 | Expired |
| US7256591B2 | Probe card, having cantilever-type probe and method | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.