Ni SHEN
4Patents
1h-index
7Co-inventors
33Inventor score
Filing activity: Mar 1, 2016 → Aug 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10670654B2 | Probe card and wafer testing system and wafer testing method | Electricity | 2 | Active |
| US11105848B2 | Probe card with angled probe and wafer testing method using the same | Electricity | 1 | Active |
| US11994555B2 | Probe card with angled probe and wafer testing method using the same | Electricity | 0 | Active |
| US11687211B2 | System and method for dossier creation with linking dossiers and context passing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.