P. Anthony Crossley
5Patents
5h-index
4Co-inventors
48Inventor score
Filing activity: Apr 2, 1985 → Oct 24, 1990
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5109430A | Mask alignment and measurement of critical dimensions in integrated circuits | Physics | 76 | Expired |
| US4924506A | Method for directly measuring area and volume using binocular stereo vision | Physics | 31 | Expired |
| US4704342A | Photomask having a patterned carbon light-blocking coating | Emerging Cross-Sectional Technologies | 13 | Expired |
| US4965842A | Method and apparatus for measuring feature dimensions using controlled dark-field illumination | Physics | 12 | Expired |
| US5062567A | Lead design to facilitate post-reflow solder joint quality inspection | Emerging Cross-Sectional Technologies | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.