Paul Chipman
3Patents
3h-index
5Co-inventors
36Inventor score
Filing activity: Mar 24, 2000 → Nov 20, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6721695B1 | Method and apparatus for evaluating the runability of a photomask inspection tool | Physics | 38 | Expired |
| US6482557B1 | Method and apparatus for evaluating the runability of a photomask inspection tool | Physics | 6 | Expired |
| US6720114B1 | METHOD OF FORMING AN ALTERNATING PHASE SHIFT CIRCUITRY FABRICATION MASK, METHOD OF FORMING A CIRCUITRY FABRICATION MASK HAVING A SUBTRACTIVE ALTERNATING PHASE SHIFT REGION, AND ALTERNATING PHASE SHIFT MASK | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.