Paul Smith
24Patents
10h-index
49Co-inventors
75Inventor score
Filing activity: Apr 5, 1993 → Jan 10, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6258223A | In-situ electroless copper seed layer enhancement in an electroplating system | Electricity | 310 | Expired |
| US6350320B1 | Heater for processing chamber | Electricity | 247 | Expired |
| US7930160B1 | Electronic markup of executable models | Physics | 215 | Active |
| US5671141A | Computer program architecture for onboard vehicle diagnostic system | Physics | 93 | Expired |
| US5983906A | Methods and apparatus for a cleaning process in a high temperature, corrosive, plasma environment | Emerging Cross-Sectional Technologies | 90 | Expired |
| US7026238B2 | Reliability barrier integration for Cu application | Electricity | 78 | Expired |
| US6112697A | RF powered plasma enhanced chemical vapor deposition reactor and methods | Electricity | 46 | Expired |
| US6227141A | RF powered plasma enhanced chemical vapor deposition reactor and methods | Electricity | 17 | Expired |
| US6159867A | RF powered plasma enhanced chemical vapor deposition reactor and methods of effecting plasma enhanced chemical vapor deposition | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6235646A | RF powered plasma enhanced chemical vapor deposition reactor and methods of effecting plasma enhanced chemical vapor deposition | Emerging Cross-Sectional Technologies | 11 | Expired |
| US7112961B2 | Method and apparatus for dynamically measuring the thickness of an object | Physics | 8 | Expired |
| US8336025B1 | Pattern modeling methods and systems | Physics | 8 | Active |
| USD918254S1 | Display screen with graphical user interface | General | 7 | Active |
| US6753248B1 | Post metal barrier/adhesion film | Electricity | 5 | Expired |
| US8525813B1 | Multi-point interface for a graphical modeling environment | Physics | 5 | Active |
| US8776015B1 | Pattern modeling methods and systems | Physics | 5 | Active |
| US7355394B2 | Apparatus and method of dynamically measuring thickness of a layer of a substrate | Physics | 4 | Active |
| US8519979B1 | Multi-point interface for a graphical modeling environment | Physics | 3 | Active |
| US7777483B2 | Method and apparatus for measuring a thickness of a layer of a wafer | Physics | 3 | Active |
| US6893548B2 | Method of conditioning electrochemical baths in plating technology | Chemistry; Metallurgy | 3 | Expired |
| US6705246B2 | RF powered plasma enhanced chemical vapor deposition reactor and methods of effecting plasma enhanced chemical vapor deposition | Emerging Cross-Sectional Technologies | 3 | Expired |
| US6395128B2 | RF powered plasma enhanced chemical vapor deposition reactor and methods of effecting plasma enhanced chemical vapor deposition | Emerging Cross-Sectional Technologies | 2 | Expired |
| US10705687B1 | Visually indicating on a user interface lengths, types of content, structure and current user location within a corpus of electronic content | Physics | 1 | Active |
| US6533894B2 | RF powered plasma enhanced chemical vapor deposition reactor and methods of effecting plasma enhanced chemical vapor deposition | Emerging Cross-Sectional Technologies | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.