Peng Luan
3Patents
0h-index
7Co-inventors
21Inventor score
Filing activity: Dec 16, 2020 → Dec 14, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11971451B2 | Method for determining parameters in on-wafer calibration piece model | Physics | 0 | Active |
| US11733298B2 | Two-port on-wafer calibration piece circuit model and method for determining parameters | Physics | 0 | Active |
| US11385175B2 | Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.