Peter Gnauck
4Patents
4h-index
7Co-inventors
39Inventor score
Filing activity: Jan 23, 1998 → Jul 16, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6855938B2 | Objective lens for an electron microscopy system and electron microscopy system | Electricity | 44 | Expired |
| US7462839B2 | Detector for variable pressure areas and an electron microscope comprising a corresponding detector | Electricity | 14 | Expired |
| US6218663A | Process and device for ion thinning in a high resolution transmission electron microscope | Electricity | 14 | Expired |
| US6872956B2 | Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device | Electricity | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.