Prabhakar Goel
6Patents
4h-index
4Co-inventors
50Inventor score
Filing activity: Nov 20, 1978 → Dec 9, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4293919A | Level sensitive scan design (LSSD) system | Physics | 48 | Expired |
| US4504784A | Method of electrically testing a packaging structure having N interconnected integrated circuit chips | Physics | 43 | Expired |
| US4204633A | Logic chip test system with path oriented decision making test pattern generator | Physics | 40 | Expired |
| US4494066A | Method of electrically testing a packaging structure having n interconnected integrated circuit chips | Physics | 34 | Expired |
| US11556508B1 | Machine learning system for automated attribute name mapping between source data models and destination data models | Physics | 1 | Active |
| US11977524B2 | Machine learning system for automated attribute name mapping between source data models and destination data models | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.