Inventor · New York, NY, US

Ramesh Karri

16Patents
5h-index
18Co-inventors
63Inventor score

Filing activity: Oct 31, 1997 → May 3, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US6363506B1 Method for self-testing integrated circuits Physics 27 Expired
US6052808A Maintenance registers with Boundary Scan interface Physics 23 Expired
US7212495B2 Signaling for reserving a communications path Electricity 14 Expired
US8005209B2 Invariance based concurrent error detection for the advanced encryption standard Electricity 7 Active
US9081991B2 Ring oscillator based design-for-trust Physics 5 Active
US10083303B2 System, method and computer-accessible medium for security verification of third party intellectual property cores Physics 3 Active
US11709939B2 Anomaly detection in real-time multi-threaded processes on embedded systems and devices using hardware performance counters and/or stack traces Physics 2 Active
US10289577B2 System, method and computer-accessible medium for low-overhead security wrapper for memory access control of embedded systems Physics 2 Active
US10423749B2 System, method and computer-accessible medium for providing secure split manufacturing Physics 2 Active
US10783248B2 Determining an aspect of behavior of an embedded device such as, for example, detecting unauthorized modifications of the code and/or behavior of an embedded device Physics 1 Active
US9081929B2 Systems, processes and computer-accessible medium for providing logic encryption utilizing fault analysis Electricity 1 Active
US10153769B2 Systems, processes and computer-accessible medium for providing logic encryption utilizing fault analysis Electricity 1 Active
US9817980B2 System, method and computer-accessible medium for facilitating logic encryption Electricity 1 Active
US10735438B2 System, method and computer-accessible medium for network intrusion detection Electricity 1 Active
US10614187B2 System, method and computer-accessible medium for security-centric electronic system design Physics 0 Active
US10073728B2 System, method and computer-accessible medium for fault analysis driven selection of logic gates to be camouflaged Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.